Improving performance of parameter extractors through symbolic simulation

In parameter extraction programs, the performance of repeated analyses of linear (or linearized) circuits can be significantly improved by representing the dependence of circuit responses on some parameters in a symbolic form. This symbolic form can then be evaluated very efficiently for different sets of parameter values. An intergrated numerical-symbolic parameter extraction program, called FIT-S, has been developed in which all linear circuit analyses can be performed using a symbolic or numerical approach. A comparisons of execution times is presented for extraction of a submicron HEMT's parameters.