Accounting for soft errors in memory reliability prediction

Presents a method for quantifying the contribution of uncorrectable soft errors in a scrubbed memory to the prediction of memory reliability. For most analyses involving memory scrubbing, the assumption that all soft errors are scrubbed does not introduce significant error into the predicted reliability calculation. This is true for the basic assumptions made; particularly the assumption of independent events. When correlation between hard failures and soft errors does exist, as in the case of an electrical transient causing permanent cell damage as well as a single event upset, contribution of uncorrectable soft errors must be readdressed.<>