Fabrication of metallic tip emitters using the scanning tunneling microscope

Summary form only given. A technology for fabrication of metallic tip emitters using the scanning tunneling microscope (STM) has been developed. Results are presented of in situ investigations of tip emitters fabricated using STM in a field ion microscope, field electron emission microscope and field electron emission spectrometer. The field emission images, field emission current-voltage characteristics and total energy distribution of emitted electrons have been obtained. The tip formation mechanism is discussed. Factors influencing the tip parameters and field emission characteristics are considered: pulsed action modes, material and thickness of multilayer structures.