Transistor leakage fault location with I/sub DDQ/ measurement

This paper discusses the problem of locating transistor leakage faults with only I/sub DDQ/ measurement. A new approach of equivalence fault collapsing is proposed for reducing the number of faults that must be considered. Fault location is performed by using both random and deterministic tests in order to obtain a high diagnostic resolution with a small number of tests. The experimental results show that the diagnosed faults are confined to only a few gates in many cases and that a very high average diagnostic resolution can be achieved for a gate-array circuit.