Fabrication of 2-D photonic crystal structure using LiNbO3 thin film on sapphire substrate

A 2-dimentional photonic crystal structure was fabricated using a c-axis oriented LiNbO3 thin film on a sapphire substrate. The dispersion characteristics in the fabricated photonic crystal structure were measured in detail by using the attenuated total reflection (ATR) method. The measurement results imply that the photonic band-gap was obtained for TE modes in the fabricated structure.