Design for test standards-where are they taking us?

Several standards committees are developing standards for design-for-test that can be applied to products from chips through to systems. A selection of these standards is highlighted. While these standards have been developed independently, they share a common underlying model of how the test problem can be hierarchically decomposed. This allows them to be used in concert to solve the complex test and diagnosis problems faced by those who test end-user products such as computers and communications equipment, in the factory or in the field. The goal of this presentation is to describe this underlying model and thus provide a view of where design-for-test standards will ultimately lead us.