A Generalized Time-Domain Waveform Test-Set

This paper addresses the problem of obtaining affordable and fast voltage and current time domain waveforms of non-linear devices, and describes a generalized testing solution which can be applied by anyone in possession of a Vector Network Analyzer (VNA) and a Sampling Oscilloscope of any kind. Some details on the typical issues arising when calibrating such a measurement system are given. Also, a possible calibration solution is described. Finally, a measurement set-up currently in use at Freescale Semiconductor is shown and some measurement examples obtained with this system are given.