Application of Co-Zr Based Amorphous Thin Film to Perpendicular Recording Head

Since during the manufacture of thin film heads, the properties of Co-base amorphous films tend to deteriorate, the authors investigated the effects of head production processes on such films. Films were RF sputtered and annealed in a rotating magnetic field, and used to construct perpendicular heads, with film properties measured before and after head construction. Deterioration of μ and M_s with machining was due in part to the large magnetostriction coefficient, and to heating and pressure application during machining.