Transient radiation test techniques for high-speed analog-to-digital converters

Test techniques have been developed for analyzing high-speed ADC (analog/digital converter) performance in both heavy-ion and prompt-gamma environments. The techniques allow relevant data to be extracted from the vast quantity of output data generated by the ADC. During heavy-ion exposure, data are collected for 10-100 s with a DC input signal, and the frequency of upset is analyzed. In the prompt-gamma environment, both DC and AC inputs to the ADC can be analyzed for data upset and recovery time. The test techniques enhance the ability to analyze the upsets for an extended period of time and to synchronize the data with the clock. Preliminary test data are shown to support the validity of the techniques.<>