A model for proton-induced SEU

The authors present a method for predicting proton-induced single-event upset (SEU) rates in devices exposed to given proton fluxes, within a particular spacecraft shielding. The approach uses experimental heavy-ion cross-section data, combined with nuclear reaction calculations, in order to determine the proton-induced SEU cross section versus proton energy relationship. Calculations for two devices, the Fairchild 93L422 RAM and the Intel 2164A dynamic RAM, for which heavy-ion test data were available, are presented and compared with other theoretical results and with ground-based experimental data. Available on-orbit SEU data are then compared with the present predictions. Predicted SEU rates for both protons and cosmic rays at various 60 degrees circular orbits are also compared. Good agreement is found in all cases.<>