Analysis of emission spectra evolution after accelerated aging of integrated circuits

Due to the increasing usage of integrated circuits (ICs) ensuring the electromagnetic compatibility (EMC) of modern electronic systems becomes more and more a major technical challenge. Especially for the automotive industry the undisturbed operation of electronics systems is of vital importance for the safety and the reliability of motorized vehicles. Moreover with CMOS nanometric technologies, new degradation mechanisms at device level appear involving a drift in electromagnetic behavior. This paper presents the evolution of emission spectrum of a mixed component for automotive applications after accelerated aging.