Progress on modeling of ultrafast x-ray streak cameras

Streak cameras continue to be useful tools for studying phenomena on the picoseconds time scale. We have employed accelerator modeling tools to understand and possibly improve the time resolution of present and future streak cameras. This effort has resulted in an end-to-end model of the camera. This model has contributed to the recent measurement of 230 fsec (FWHM) resolution measured at 266 nm in the Advanced Light Source Streak Camera Laboratory. We describe results from this model that show agreement with the experiments. We also extrapolate the performance of this camera including several possible improvements.