The impact of system impedance on the characterization of high power devices

This paper focuses on the extension of the successful application of current and voltage waveform engineering of on-wafer devices to power levels relevant to both handset and basestation markets. Effects on the measured waveforms caused by a 50Omega characteristic impedance of the measurement system are investigated showing a significant effect at the lower and crucially at higher harmonics, which is in contrast to the current school of thought. For the first time a waveform based analysis of packaging affects is presented, allowing the effects of the system's higher harmonic impedances to be studied and considered in the context of de-embedding measured waveforms. Measured de-embedded waveforms are compared with simulated equivalents model and are found to be in good agreement.