Proposal for high accuracy linearity test of triangular waveform generators

This paper addresses the possibility of testing, with high accuracy, triangular waveform generators using a procedure inspired on the Ramp Vernier Test of Analog to Digital Converters. This allows the use of a low cost data acquisition board to efficiently measure the nonlinearity of a triangular waveform. The idea is to use the waveform generator under test to produce the stimulus signal for the testing of the data acquisition system and then use the results of that test to correct its nonlinearity. This removes the influence of the acquisition system’s nonlinearity on the estimation of nonlinearity of the waveform generator.