ΔIDDQ testing of a 12-bit recycling architecture based ADC

In this paper, we present a built-in current sensor (BICS) for ΔI_DDQ based testing that takes into account increased background current of defect-free circuits. A 12-bit recycling architecture based analog-to-digital converter (ADC), designed for operation at 2.5 V in 0.5 μm n-well CMOS process has been used as the CUT.