Results of Recent 14 MeV Neutron Single Event Effects Measurements Conducted by the Jet Propulsion Laboratory

This paper reports 14 MeV neutron induced single-event effects results for a variety of microelectronic devices that include an ADC, operational amplifiers, optocoupler, flash memory, PowerPC microprocessor, SRAM, and SDRAM. Data were collected to evaluate these devices for possible use in NASA spacecraft.