Flash X-Ray Test of the CMOS/SOS SCP-STAR ALU

This paper reports on the measurement of the x-ray upset dose rate for a subsystem which was designed to represent the ALU part of the SCP-STAR spacecraft computer. This computer was fabricated totally with radhard, CMOS/SOS devices. The test was conducted at the OWL flash x-ray facility of Physics International. The results showed that the upset dose rate for the subsystem was 9.8×1010 and 1.7×1011 rads(Si)/s during dynamic and static modes of operation, respectively. Subsystem interactions did not compromise the upset levels of the discrete components.