Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test set

We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2^m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsysreg tool is used to generate ATPG based test patterns.