The Structure and Magnetic Properties of CoNbZr-Sm2O3 Granular Films

In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).