Infrared Optical Properties of Bi4-xNdxTi3O12 Thin Films Prepared by a Chemical Solution Method

Infrared optical properties of Bi
_4-x
Nd
_x
Ti
₃
O
₁₂
[BNT(x=0,0.25,0.50,0.75)] thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5-11.4mum (0.11-0.50eV). Their refractive index decreased and extinction coefficient increased as the wavelength increased. Both the refractive index and the extinction coefficient decreased as the concentration of Nd increased. In addition, the wavelength and Nd concentration dependence of the absorption coefficient showed the similar behavior to that of the extinction coefficient.