Reliability Aspects of Nichrome Fusible Link PROM's (Progammable Read Only Memories)

Reliability aspects of nichrome fusible link PROM's have been investigated and are defined in the areas of manufacturing, screening, testing and programming. Early mortality failure populations are analyzed and long term life considerations explored, The "grow-back" mechanism, a failure mode involving the relinking of fuses, is characterized and discussed in terms of design, programming, screening, testing and reliability.