Systematic Experimental and Numerical Characterization of Integrated Spiral Inductors in Silicon RF ICs

A systematic discussion of the main strategies available to improve the performance of silicon integrated inductors is carried out, relying on on-chip measurement related to a specific CMOS technology. Then, a "full-wave" electromagnetic simulator has been customized and validated for the accurate characterization of devices of interest. Finally, such a capability has been applied to extend the discussion to a different foundry process.