The microwave measurement of surface roughness

A new principle of microwave measurement of surface roughness has been developed. The new method is based on scattering property of rough surface under microwave energy radiation. The relations between surface roughness and reflected microwave power are found for the first time. A single chip microcomputer is used for processing and displaying the results. This method features real time operation and non-contact inspection as well as ease of applications. Less than 5% measurement erros has been achieved.