I-V Characteristic of Diamond Pparticles and Planner Electron Emission Based on Diamond Films

Summary form only given. I-V characteristics of diamond particles deposited on molybdenum tips were measured in scanning electron microscopy (SEM) chamber by introducing a Mo tip to the system as measurement probe. The I-V characteristic and field emission of the diamond particle on Mo substrates (tips) strongly depend on its quality. Furthermore, planner field electron emitter based on polycrystalline diamond film was developed by using a plane gated cathode with diode structure. A possible mechanism of the I-V characteristic and field emission from diamond was discussed