Radiation Characteristics of Electrically Small Devices in a TEM Transmission Cell

When making EMC measurements inside a shielded enclosure, the radiation characteristics of the device being tested changes. In this paper, the change in radiation resistance of dipole sources located inside a National Bureau of Standards TEM transmission cell is determined. In many cases a practical device can be modeled by dipole sources. In these cases the analysis allows one to predict the device's radiation characteristics in other environments (e. g., free space).