Boundary Scan for Structural Board Test on LXI Platform

JTAG/Boundary Scan tools for LXI¹ allow a powerful and flexible combination with other test methodologies. This paper shortly discusses benefits and shortcomings of JTAG/Boundary Scan and Functional Test and then outlines possibilities of integrating Boundary Scan tools in a LXI based test environment. Advantages of such a combination of Boundary Scan and Functional Test equipment are illustrated. Furthermore, an introduction to JTAG/ Boundary Scan related Design-For-Testability will be provided.