Cross Talk Coupling, a Tool to Characterize Electromagnetic Immunity of Integrated Circuits

The paper deals with use of cross talk coupling throughout transmission lines in order to determine electromagnetic sensitivity of integrated circuits. Some experimental data will be proposed to point out the relationship between occurrence of the resonance on the line and non linear effects due to ESD clamping diode placed at IC's input. To conclude some details are brought to extend cross talk data to the general case of the lines under plane wave radiation