Complex Parameters' Measurement of a Parallel-Sided Plate Material Located in the Waveguide

Correlations interconnecting complex reflectivity factor (CRF) and complex transfer factor (CTF) with integrated parameters of a parallel-sided plate material located in the rectangular cross-section waveguide are obtained. Method of high frequency measuring of super-high frequency (SHF) of plate parameters is stated; and method of determination of material and imaginary components of complex permittivity and complex magnetic conductivity of material on the basis of this measuring is given.