Determination of temperature distributions in electret foils

A method is proposed in which known charge profiles (e.g., electron-beam-deposited charge layers) serve as probes for the temperature distribution as it develops after heat-pulse excitation of one of the sample electrodes. The principal of operation is discussed and first experiments are reported. Heat-transport parameters of electret materials can be determined from the results. The validity of the method is demonstrated by preliminary experimental results for electron-beam-charged Teflon FEP samples.<>