Performance and reliability of NIST 10-V Josephson arrays

This paper reviews eight years of fabrication of 10-V Josephson array chips at NIST, and the performance and reliability of these chips at 22 different standards laboratories. Failure mechanisms and statistical data on failure rates are presented for devices made with both Nb/Nb/sub 2/O/sub 5//Pb and Nb/Al/sub 2/O/sub 3//Nb junctions.<>