Static and dynamic testing of A/D converters using a VXI based system

A VXIbus based system to test analog to digital converters (ADC's) is presented. The system can perform both static and dynamic tests. In the static test the input voltage of the converter is generated by an IEEE 488 programmable dc calibrator. Dynamic test is based on the analysis of the converter output when a known sinusoidal input voltage is applied to the ADC. The differential and integral nonlinearities, gain and offset errors of the converter are obtained in both tests. Results for a 12 bit ADC are presented.<>