A Monte-Carlo method applied to backscattering from wheat at X-band

Backscattering from wheat at X-band is numerically simulated by the Monte-Carlo method where interactions between electromagnetic waves and wheat are modelled as photon collisions with discrete scatterers (modelled as elliptical disks) continuously. Given the parameters of the wheat derived in experiments or the reasonable values assumed, simulation results by a half-space model agree with experimental ones by the authors' scatterometer.<>