A high-voltage ATE pin driver

The author describes a pin driver for automatic test equipment. The goals of this pin driver design were greater than 20 V of output swing, a 1-V/ns edge rate, and ruggedness in its intended industrial environment while using an economical integrated process. Delay and tristate times were 3 and 6 ns, respectively, and delay dispersion was typically 250 ps. The device was constructed with a complementary bipolar process utilizing dielectric isolation, and was extremely rugged.<>