An edge detection ASIC for real time defect detection

The design of a low cost real-time image processing microsystem for detecting defects in manufacturing products is presented. The analysis method is based on an edge detection algorithm (differential operators) to select the information related to the structure of the objects present in the image. The edge calculation function is integrated in a standard cell circuit, using a CMOS 1.5- mu m process. The ASIC is implemented and tested in an image processing microsystem with a CCD camera. Results show an improvement of performance in comparison with the first prototypes, allowing the use of this system in an industrial environment for the real-time detection of defects.<>