Broadband material characterization using microstrip/stripline field applicator

A flexible field applicator for electromagnetic material parameter measurements using an automated network analyzer has been designed, operable in either stripline or microstrip mode. An effective de-embedding scheme has been used to extract the sample region scattering parameters from the measured terminal scattering parameters. The sample scattering parameters are processed to determine the phase constant and the characteristic impedance of the sample-loaded transmission region, from which the constructive parameters of the material are then determined, based upon the configuration.<>