Efficient calculation of spurious radiation from microstrip interconnects

The efficient characterization of single and coupled microstrip lines fed by a current source and terminated by complex loads, which are generally used as interconnecting elements between components in electronic packages, is an important problem, particularly from the point of view of estimating the spurious radiation from these interconnects. The authors address the problems of computing the current distribution on the interconnects, as well as the near-field distribution produced by this current distribution. To calculate the current distribution, they use a numerically, efficient technique which uses the closed-form spatial domain Green's functions in conjunction with the method of moments in the spatial domain. The level of spurious radiation, which is defined as the radiated power crossing the plane parallel to the plane of interconnects, and the electric field distribution in the near-field region are calculated by making use of the current distribution obtained previously.<>