The determination of dielectric properties at near millimetre wavelengths

Summary form only given. The author discussed methods used for dielectric measurements on solids at near millimeter wavelengths over a range of temperatures from 4.2 to values in excess of 1500 K. The methods include both resonant and nonresonant techniques, and monochromatic and broadband ones. A comparison in which a number of such techniques were used in a study of the dielectric properties of a group of specimens was discussed.<>