Detection of a gaseous organophosphorus compound using a supported copper + cuprous oxide island film

The modification of electronic properties of a dielectric-supported island film of copper plus cuprous oxide that is exposed to small concentrations (ppm levels) of diisopropyl methylphosphonate (DIMP) is reported. Electron microscopy and electron diffraction measurements confirmed the film's structure and composition. Auger spectroscopy verified the absorption of DIMP. Isothermal direct current measurements suggest a space-charge conduction mechanism whereby carriers are thermally excited, field induced, and transported via shallow trapping and impurity centers.<>