Modeling and simulation of lossy multi-coupled multilayer interconnect lines in solid-state digital circuits

For digital engineers designing picosecond or subnano-second rise time solid-state ICs, the authors provide a CAD tool for determining the slowed down rise time of a high speed pulse due to the skin effect loss in multi-coupled multilayer transmission lines. This field-based computation-efficient model provides an alternative to the experimental model reported recently and shows good agreement in both frequency and time domain compared with experimental results.<>