Analysis of rectangular anisotropic dielectric waveguide structures

The finite-difference method is used in the analysis of rectangular anisotropic waveguide structures. A formulation that was first applied to isotropic dielectric channels diffused into an isotropic dielectric is extended to include anisotropic dielectric channels and anisotropic substrates. This formulation makes it possible to analyze not only the step index of refraction profiles but also arbitrarily varying index profiles. Examples of practical interest are shown, and the results are compared with those obtained from other methods.<>