S-Parameter Extraction of Off-Set Material Samples in a Waveguide

In this paper, the authors have developed a numerical tool based on the finite element method (FEM) to assess the uncertainty in such measurements due to misalignment and other experimental difficulties common in a laboratory environment or sample defects. This tool has the advantage, over previously reported methods, in that a variety of material conditions can be readily simulated (e.g. magneto-dielectrics, anisotropic materials, etc.) In this paper three cases are primarily studied: 1) a dielectric material with low contrast, 2) a dielectric material with high contrast and 3) a magneto-dielectric material