Non-Contact Bias Voltage Measurement on Analog Microelectronic Circuits via a Special Side-Electrode-Equipped Electro-Optic Tip

The external electro-optic (EO) probing technique has been a very useful tool for the characterization of high-speed devices and circuits. In this paper, we propose a method to enable the traditional non-contact EO probing technique further direct DC bias voltage measurement via a special side-electrode-equipped electro-optic tip