Zinc-Blende Structure of CrTe Epilayers Grown on GaAs

We report the synthesis of zinc-blende CrTe (zb-CrTe) as highly oriented crystalline grains in films of 100-nm thickness. The structural properties of the film were characterized using high-resolution transmission electron microscopy (HRTEM) and selective-area electron diffraction (SAED). Temperature-dependent magnetization measurements show that the Curie temperature of the film is ~327 K. Angular M-H measurements indicate that the CrTe films have an in-plane easy axis of magnetization along the [01macr1] direction of GaAs