Diminishment of Spark Damages in MGCs by Using Diamond Thin Films

A simulation method on estimation of the anode material damage caused by spark discharges is developed. These discharges are well known to cause permanent failures of microgap gas chambers (MGCs). Systematic analysis and optimization studies have been performed through finite element methods (FEM) simulations using Ansys6.1. The results have evidently shown that, owing to their super high heat conductivity, introduction of diamond thin films (DTFs) as an insulating layer can enormously diminish or even avoid melting or vaporizing of the anodes via spark discharges. Furthermore, topological optimization and anode material selection studies using the FEM simulation technique have been carried out to enhance MGC operational stability. Samples based on the simulation results have been successfully fabricated and tested.