Measurement of low-noise column readout circuits for CMOS image sensors

This brief describes the measurement results of high-gain column readout circuits for CMOS image sensors. The measurement results show that the double-stage noise-canceling architecture has better noise performance than that of the single-stage architecture at a first-stage gain of greater than 6. The lowest input-referred noise is measured to be 49 muVrms at a gain of 24