Thin film RCG notch filter modelling

A mathematical model representing the Al-CdS-SiO-NiCr thin-film RCG structures is derived. This model takes into account the distributed leakage conductance through the CdS semi-insulating layer or through the CdS-SiO composite dielectric layer. Exponential tapered notch filters with both types of structures Al-CdS-NiCr and Al-CdS-SiO-NiCr having the same length and tapering coefficient are modeled and characterized. The composite dielectric CdS-SiO layer leads to a decreased leakage conductance, and this results in an improved performance.<>