Precision of ADC Gain and Offset Error Estimation with the Standard Histogram Test

Extensive dynamic testing of Analog to Digital Converters is often carried out using the Standard Histogram Test. With this test one can estimate the converter transfer function, including gain, offset error, integral and differential non-linearity. Since the Histogram Test is inherently a statistic test, the estimated parameters are random variables affected by bias and uncertainty. This paper verses specifically the precision of terminal based gain and offset error precision