Testing FPGAs using JBits RTP cores

In this paper, we present a fault-testing technique for field programmable gate arrays (FPGAs) that is based on the features offered by Java Bits (JBits). Our technique can detect single and multiple stuck at faults, and is capable of detecting the faulty CLB within the FPGA. The algorithm proposed for testing the faults in the CLB utilizes the unified-library primitives and the run-time parameterizable (RTP) cores of the JBits programming language. The method also explores the object-oriented approach of the Java programming language used in JBits. It has the capability of providing run-time fault avoidance in FPGAs based on the faults detected during the testing process. Since JBits involves programming directly at the bitstream level, the proposed method offers additional advantages over traditional testing techniques