A Bunch-by-Bunch and Turn-by-Turn Instrumentation Hardware Upgrade for CESR-C

A key factor in the colliding beam performance of the Cornell Electron Storage Ring (CESR) is the impact of parasitic beam-beam interactions between bunches in the two beams as they follow their electrostatically separated orbits in a single vacuum chamber. In order to better investigate the differential performance of bunches in CESR, instrumentation electronics has been developed to allow acquisition of turn-by-turn data from multiple bunches simultaneously. The electronics consists of a standardized digital board centered around an Analog Devices TigerSHARC family digital signal processor, a communications interface, and an interface to the CESR Precision Timing System. Mated to these components is an analog front-end and digitizer board which is customized for the particular diagnostic device of interest. Front-ends have been developed for beam position monitor, luminosity monitor, and beam profile monitor applications. We describe the design and characterization of this new hardware.