Electric field probing by incorporating Franz-Keldysh electroabsorption effect and optical-beam-induced-current technique

In this paper, a simple optical-beam-induced-current (OBIC) method using Franz-Keldysh (FK) effect is proposed to map the electric fields inside InP substrate. Due to electroabsorption effect, the OBIC by excitation at nearly below bandgap can directly and in-situ maps the electric field inside the substrate.